Equotip Leeb Portable Hardness Tester
Equotip Leeb Portable Hardness Tester
Product Description
- แบรนด์ : Proceq (สวิตเซอร์แลนด์)
- เครื่องวัดความแข็ง
- เครื่องวัดความแข็งแบบพกพา
Product Features
Wide Measurement Range
Leeb impact devices are best suited for on-site testing of heavy, large or already installed parts.
Broad Hardness Scales Coverage
The measurements are automatically converted to all common hardness scales (HV, HB, HRC, HRB, HRA, HS) as required.
Impact Devices & Accessories
Proceq offers a wide variety of impact devices along with support rings to serve most hardness testing requirements.
Test Blocks Portfolio
Extensive range of precise hardness test blocks available for each impact device with different hardness levels for regular verification.
The Leeb Measuring Principle Invented by Proceq
Leeb hardness principle is based on the dynamic (rebound) method. An impact body with a hard metal test tip is propelled by spring force against the surface of the test piece. Surface deformation takes place when the impact body hits the test surface, which results in loss of kinetic energy. This energy loss is detected by a comparison of velocities v, and v, when the impact body is at a precise distance from the surface for both the impact and rebound phase of the test, respectively.
Velocities are measured using a permanent magnet in the impact body that generates an induction voltage in the coil which is precisely positioned in the impact device. The detected voltage is proportional to the velocity of the impact body. Signal processing is then providing the hardness reading.
Product Technical
Equotip 550 Instrument | |
| Display | 7 color display 800x480 pixels |
| Memory | Internal 8 GB Flash memory (up to 1000000 measurements) |
| Regional settings | Metric and Imperial units, multi-language and timezone supported |
| Battery | Lithium Polymer, 3.6 V, 14.0 Ah |
| Battery lifetime | > 8h (in standard operating mode) |
| Power input | 12 V +/-25 % / 1.5 A |
| Weight (of display device) | About 1525 g (incl. Battery) |
| Dimensions | 250 x 162 x 62 mm |
| Max. altitude | 2500 m above sea level |
| Humidity | < 95 % RH, non condensing |
| Operating temperature | - 0 to 30°C (32 to 86°F) (Charging, running instrument) - 0 to 40°C (32 to 104°F) (Charging, instrument is off) - -10 to 50°C (14 to 122°F) (Non-charging) |
| Environment | Suitable for indoor & outdoor use |
| IP classification | IP 54 |
| Pollution degree | 2 |
| Installation category | 2 |
Equotip Leeb Impact Devices | |
| Native Scale | HL |
| Available Scales | HB, HV, HRA, HRB, HRC, HS, MPA |
| Available Probes | Leeb D / DC / DL / S / E / G / C |
| Combination With Other Methods | Portable Rockwell, UCI |
| Average Roughness Ra (µm / µinch) | 7 / 275 (Leeb G) |
| Minimum Mass (kg / lbs) | 0.02 / 0.045 (Leeb C) |
| Minimum Thickness (mm / inch) | 1 / 0.04 (Leeb C) |
| Standards | - ASTM A 956 - ASTM E 140 - ASTM A 370 - ISO 16859 - DIN 50156 - GB/T 17394 - JB/T 9378 |
| Guidelines | - ASME CRTD-91 - DGZfP Guideline MC 1 - VDI / VDE Guideline 2616 Paper 1 - Nordtest Technical Reports 424-1, 424-2, 424-3 |
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